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lgli/K:\!genesis\0day\wiley\9781119005063.pdf
Acta final. Final act 🔍
Denis Jalabert, Ian Vickridge, Amal Chabli Inter-American Municipal Organization, New Orleans, 1969
英语 [en] · PDF · 23.2MB · 1969 · 📘 非小说类图书 · 🚀/lgli/lgrs/nexusstc/zlib · Save
描述
Swift ion beam analysis (IBA) of materials and their surfaces has been widely applied to many fields over the last half century, constantly evolving to meet new requirements and to take advantage of developments in particle detection and data treatment.
Today, emerging fields in nanosciences introduce extreme demands to analysis methods at the nanoscale. This book addresses how analysis with swift ion beams is rising to meet such needs. Aimed at early stage researchers and established researchers wishing to understand how IBA can contribute to their analytical requirements in nanosciences, the basics of the interactions of charged particles with matter, as well as the operation of the relevant equipment, are first presented. Many recent examples from nanoscience research are then explored in which the specific analytical capabilities of IBA are emphasized, together with the place of IBA alongside the wealth of other analytical methods.
备用文件名
lgrsnf/K:\!genesis\0day\wiley\9781119005063.pdf
备用文件名
nexusstc/Acta final. Final act/1dc6bd141837d3554a49d64a2093cb98.pdf
备用文件名
zlib/Engineering/Denis Jalabert, Ian Vickridge, Amal Chabli/Acta final. Final act_3419660.pdf
备选标题
Swift Ion Beam Analysis in Nanosciences
备选作者
Jalabert, Denis; Vickridge, Ian; Chabli, Amal
备选作者
Inter-American Congress of Municipalities
备用出版商
ISTE Ltd and John Wiley & Sons Inc
备用出版商
Wiley & Sons, Incorporated, John
备用出版商
John Wiley & Sons, Incorporated
备用出版商
Wiley Global Research (STMS)
备用出版商
American Geophysical Union
备用出版商
CLE international
备用出版商
Wiley-Blackwell
备用出版商
Nouvel angle
备用出版商
Rouge et or
备用出版商
Wiley-ISTE
备用出版商
Routledge
备用版本
RSC nanoscience & nanotechnology, London, UK, Hoboken, NJ, 2017
备用版本
Nanoscience and nanotechnology series, London, UK, 2017
备用版本
United Kingdom and Ireland, United Kingdom
备用版本
John Wiley & Sons, Inc., London, UK, 2017
备用版本
United States, United States of America
备用版本
1. Auflage, New York, 2017
备用版本
London, [England, 2017
备用版本
France, France
备用版本
1, 2017-08-07
备用版本
2016
元数据中的注释
lg2178337
元数据中的注释
{"isbns":["111900506X","1119008670","1848215770","2092112112","9781119005063","9781119008675","9781848215771","9782092112113"],"last_page":231,"publisher":"Inter-American Municipal Organization"}
备用描述
Cover -- Half-Title Page -- Title Page -- Copyright Page -- Contents -- Preamble: Rutherford and IBA -- Introduction -- I.1. Interactions with electrons -- I.2. Elastic scattering from nuclei -- I.3. Nuclear reactions -- 1. Fundamentals of Ion-solid Interactions with a Focus on the Nanoscale -- 1.1. General considerations -- 1.1.1. Wavelengths of ions, electrons and X-rays -- 1.1.2. Penetration depths of ions, electrons and X-rays -- 1.2. Basic physical concepts -- 1.2.1. Energy loss and range of ions in matter -- 1.2.2. Energy straggling -- 1.2.3. Elastic scattering -- 1.3. Channeling, shadowing and blocking -- 1.3.1. Channeling -- 1.3.2. Shadowing -- 1.3.3. Blocking -- 1.4. 1D layers: limits to depth resolution -- 1.5. 2D and 3D objects: aspects of lateral resolution -- 1.5.1. Beam focusing -- 1.5.2. Simulation of nanostructures -- 2. Instruments and Methods -- 2.1. Instruments -- 2.1.1. Accelerators -- 2.1.2. Detectors and data acquisition -- 2.1.3. Analysis chambers -- 2.2. Methods -- 2.2.1. RBS and MEIS -- 2.2.2. ERDA -- 2.2.3. Narrow resonance profiling -- 3. Applications -- 3.1. Example of resonances/light element profiling -- 3.1.1. Introduction -- 3.1.2. Channeling study of the SiO2/Si interface -- 3.1.3. Narrow resonance profiling and stable isotopic tracing studies of the oxidation of silicon -- 3.1.4. Thermal oxidation of silicon carbide -- 3.1.5. Diffusion and reaction of CO in thermal SiO2: transport, exchange and SiC nanocrystal growth -- 3.2. Quantitative analysis/heavy element profiling -- 3.2.1. RBS quantitative analysis of quantum dots and quantum wells -- 3.2.2. CMOS transistors and the race for miniaturization -- 3.3. Examples of HR-ERD analysis -- 3.3.1. Introduction -- 3.3.2. HRBS/HR-ERD comparison -- 3.3.3. HR-ERD profiles of Al2O3/TiO2 nanolaminates -- 3.4. Channeling/defect profiling -- 3.4.1. Introduction
备用描述
Swift ion beam analysis (IBA) of materials and their surfaces has been widely applied to many fields over the last half century, constantly evolving to meet new requirements and to take advantage of developments in particle detection and data treatment. Today, emerging fields in nanosciences introduce extreme demands to analysis methods at the nanoscale. This book addresses how analysis with swift ion beams is rising to meet such needs. Aimed at early stage researchers and established researchers wishing to understand how IBA can contribute to their analytical requirements in nanosciences, the basics of the interactions of charged particles with matter, as well as the operation of the relevant equipment, are first presented. Many recent examples from nanoscience research are then explored in which the specific analytical capabilities of IBA are emphasized, together with the place of IBA alongside the wealth of other analytical methods. -- ISTE, Ltd. website
开源日期
2018-02-03
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