Silicon Nitride for Microelectronic Applications : Part 2 Applications and Devices 🔍
John T. Milek (auth.) Springer US : Imprint : Springer, 1, 1972
英语 [en] · PDF · 3.4MB · 1972 · 📘 非小说类图书 · 🚀/lgli/lgrs/nexusstc/zlib · Save
描述
This survey is concerned with the use of silicon nitride in the semi conductor and microelectronics industries. The Handbook of Electronic Materials, volume 3, comprises part 1 of this survey and includes preparation and properties information. This report was prepared by Hughes Aircraft Company, Culver City, California under Contract Number F336lS-70-C-1348. The work was admini stered under the direction of the Air Force Materials Laboratory, Air Force Systems Command, Wright-Patterson Air Force Base, Ohio, with Hr. B. Emrich, Project Engineer. The Electronic Properties Information Center (EPIC) is a designated Information Analysis Center of the Department of Defense, authorized to pro vide information to the entire DoD community. The purpose of the Center is to provide a highly competent source of information and data on the electronic, optical and magnetic properties of materials of value to the Department of Defense. Its major function is to evaluate, compile and publish the experi mental data from the world's unclassified literature concerned with the properties of materials. All materials relevant to the field of electronics are within the scope of EPIC: insulators, semiconductors, metals, super conductors, ferrites, ferroelectrics, ferromagnetics, electroluminescents, thermionic emitters and optical materials. The Center's scope includes information on over 100 basic properties of materials; information generally regarded as being in the area of devices and/or circuitry is excluded. v CONTENTS Foreword. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . v Introduction. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 Diffusion Mask Applications . . . . . . . . . . . .. . . . . . . . . . . . . . . '" 11 Glass-to-Metal Seals . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23 Passivation Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24 Isolation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39 Memory Devices. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41 Capacitors. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 76 Radiation Hardening Applications . . . . . . . . . . . . . . . •. . . . . . . . .
Erscheinungsdatum: 21.01.2013
备用文件名
lgrsnf/A:\compressed\10.1007%2F978-1-4615-9609-7.pdf
备用文件名
nexusstc/Silicon Nitride for Microelectronic Applications: Part 2 Applications and Devices/5e680e6d3621902ec8c4abd4972e0ba2.pdf
备用文件名
zlib/Engineering/John T. Milek (auth.)/Silicon Nitride for Microelectronic Applications: Part 2 Applications and Devices_2108481.pdf
备选作者
by John T. Milek
备用版本
Handbook of electronic materials, v. 3, etc, Boston, MA, 1972
备用版本
United States, United States of America
备用版本
Springer Nature, New York, NY, 2013
备用版本
Boston, MA, United States, 1972
备用版本
1, 2013
元数据中的注释
lg954584
元数据中的注释
{"edition":"1","isbns":["1461596092","1461596114","9781461596097","9781461596110"],"last_page":117,"publisher":"Springer US"}
元数据中的注释
Online full text is restricted to subscribers.
Also available in print.
Mode of access: World Wide Web.
备用描述
This survey is concerned with the use of silicon nitride in the semiƯ conductor and microelectronics industries. The Handbook of Electronic Materials, volume 3, comprises part 1 of this survey and includes preparation and properties information. This report was prepared by Hughes Aircraft Company, Culver City, California under Contract Number F336lS-70-C-1348. The work was adminiƯ stered under the direction of the Air Force Materials Laboratory, Air Force Systems Command, Wright-Patterson Air Force Base, Ohio, with Hr. B. Emrich, Project Engineer. The Electronic Properties Information Center (EPIC) is a designated Information Analysis Center of the Department of Defense, authorized to proƯ vide information to the entire DoD community. The purpose of the Center is to provide a highly competent source of information and data on the electronic, optical and magnetic properties of materials of value to the Department of Defense. Its major function is to evaluate, compile and publish the experiƯ mental data from the world's unclassified literature concerned with the properties of materials. All materials relevant to the field of electronics are within the scope of EPIC: insulators, semiconductors, metals, superƯ conductors, ferrites, ferroelectrics, ferromagnetics, electroluminescents, thermionic emitters and optical materials. The Center's scope includes information on over 100 basic properties of materials; information generally regarded as being in the area of devices and/or circuitry is excluded. v CONTENTS Foreword. ... ... ... ... ... ... ... ... v Introduction. ... ... ... ... ... ... ... . . 1 Diffusion Mask Applications ... ... ... ... ... '" 11 Glass-to-Metal Seals ... ... ... ... ... ... . 23 Passivation Applications ... ... ... ... ... ... 24 Isolation ... ... ... ... ... ... ... ... 39 Memory Devices. ... ... ... ... ... ... ... 41 Capacitors. ... ... ... ... ... ... ... ... 76 Radiation Hardening Applications ... ... ..." ...
备用描述
Front Matter....Pages i-vii
Introduction....Pages 1-10
Diffusion Mask Applications....Pages 11-22
Glass-to-Metal Seals....Pages 23-23
Passivation....Pages 24-38
Isolation....Pages 39-40
Memory Devices....Pages 41-75
Capacitors....Pages 76-86
Radiation Hardening Applications....Pages 87-98
Miscellaneous Devices and Applications....Pages 99-108
Back Matter....Pages 109-117
备用描述
Diffusion Mask Applications.- Glass-to-Metal Seals.- Passivation Applications.- Isolation.- Memory Devices.- Capacitors.- Radiation Hardening Applications.- Miscellaneous Devices and Applications.- References
开源日期
2013-08-01
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