Statistical Methods for Industrial Process Control was written to provide working engineers and engineering students with the statistical tools they must understand to practice engineering effectively. Statistical principles are illus­ trated with authentic semiconductor manufacturing processes examples-a prac­ tice that enables experienced engineers to build upon existing knowledge to leam new skills, and that introduces students to a fascinating industry. Integrated circuit fabrication is an exceeding rich medium for communicating statistical concepts: the industry must perform to extraordinary tolerances­ controlling film thickness to within 5 A, for example. Semiconductor develop­ ment is driven by frenzied innovation and worldwide competition, so process equipment and metrology must exploit the boundaries of physics, chemistry, and industrial engineering knowledge. A wide variety of statistical concepts can be exercised in the context of semiconductor fabrication, and once learned, they can easily be applied to other industries. This text emphasizes the application of statistical tools, rather than statistical theory. Modem advances in statistical software have made tedious computations and formula memorization unnecessary, so engineers with knowledge of a few statistical tools can competently practice statistics within the context of their profession. Software use is demonstrated throughout the book to promote better under­ standing through graphical and statistical analysis. A statistical software appen­ dix gives example SASI programs sufficient to perform the analyses in the text. 2 Some examples are shown with Minitab as well. I SAS is a trademark of SAS Institute Inc., SAS Campus Drive, Cary, NC 27513.

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nexusstc/Statistical Methods for Industrial Process Control/5e8b5157aa6eeaba4e53dfa4b021dc2b.pdf

zlib/Engineering/David Drain (auth.)/Statistical Methods for Industrial Process Control_2092052.pdf

Dauid Drain

Springer-Science+Business Media, B.V.; International Thomson Pub.

Solid state science and engineering series, Chapman & Hall solid state science and engineering series, Dordrecht, Netherlands, 1997

Chapman & Hall solid state science and engineering series, Boston, MA, 1997

United States, United States of America

lg938175

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"Originally published by Chapman & Hall in 1997, softcover reprint of the hardcover 1st edition 1997"--t.p. verso.
Includes bibliographical references and index.

Content:
Front Matter....Pages i-xv
Basic Probability and Statistics....Pages 1-115
Linear Regression Analysis....Pages 116-190
Variance Components and Process Sampling Design....Pages 191-227
Measurement Capability....Pages 228-281
Introduction to Statistical Process Control....Pages 282-299
Statistical Process Control Implementation....Pages 300-389
Back Matter....Pages 391-456

2013-08-01