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lgli/A:\_for_add\1\SD\9780444851291 (14).pdf
Diffraction and imaging techniques in material science. Volume II, Imaging and diffraction techniques 🔍
S Amelinckx; R Gevers; J. van Landuyt; International Summer Course on Material Science Elsevier Science & Technology Books, Diffraction and imaging techniques in material science / eds. S. Amelinckx, / eds. S. Amelinckx ... ; Vol. 2, 2., rev. ed, Amsterdam, 1978
英语 [en] · PDF · 11.0MB · 1978 · 📘 非小说类图书 · 🚀/lgli/lgrs/nexusstc/zlib · Save
描述
Diffraction and Imaging Techniques in Material Science P2
Abstract: Diffraction and Imaging Techniques in Material Science P2
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lgrsnf/A:\_for_add\1\SD\9780444851291 (14).pdf
备用文件名
nexusstc/Diffraction and Imaging Techniques in Material Science. Imaging and Diffraction Techniques/671c84b180463047400df91e9e4f7b38.pdf
备用文件名
zlib/Engineering/S Amelinckx (Eds.)/Diffraction and Imaging Techniques in Material Science. Imaging and Diffraction Techniques_2219040.pdf
备选标题
Diffraction and Imaging Techniques in Material Science: Imaging and Diffraction Techniques v. 2
备选标题
Diffraction and Imaging Techniques in Material Science P2 : Imaging and Diffraction Techniques
备选标题
Diffraction and Imaging Techniques in Materials Science
备选作者
Severin Amelinckx; Universitaire Faculteiten Sint-Ignatius; International Summer Course on Material Science
备用出版商
North-Holland Pub. Co. : Sole distributors for the U.S.A. and Canada, Elsevier North-Holland
备用出版商
Wolters Kluwer Legal & Regulatory U.S.
备用出版商
North-Holland Publishing Co
备用出版商
Aspen Publishers
备用版本
2nd, rev. ed, Amsterdam, New York, 1978
备用版本
United States, United States of America
备用版本
2nd, revised ed, Amsterdam, 1978
备用版本
2nd ed, Amsterdam, 2014
备用版本
1978-12-
备用版本
2, 2012
元数据中的注释
lg1050012
元数据中的注释
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备用描述
Diffraction and Imaging Techniques in Material Science reviews recent developments in diffraction and imaging techniques used in the study of materials. It discusses advances in high-voltage electron microscopy, low-energy electron diffraction (LEED), X-ray and neutron diffraction, X-ray topography, mirror electron microscopy, and field emission microscopy. Organized into five parts encompassing nine chapters, this volume begins with an overview of the dynamical theory of the diffraction of high-energy electrons in crystals and methodically introduces the reader to dynamical diffraction in perfect and imperfect crystals, inelastic scattering of electrons in crystals, and X-ray production. It then explores back scattering effects, the technical features of high-voltage electron microscopes, and surface characterization by LEED. Other chapters focus on the kinematical theory of X-ray diffraction, techniques and interpretation in X-ray topography, and interpretation of the contrast of the images of defects on X-ray topographs. The book also describes theory and applications of mirror electron microscopy, surface studies by field emission of electrons, field ionization and field evaporation, and gas-surface interactions before concluding with a discussion on lattice imperfections. Scientists and students taking courses on diffraction and solid-state electron microscopy will benefit from this book.
备用描述
Content:
Front Matter , Page iii
Copyright , Page iv
PREFACE TO THE FIRST EDITION , Page v , The Organizing Committee
PREFACE TO THE SECOND EDITION , Page vi
THE THEORY OF HIGH ENERGY ELECTRON DIFFRACTION , Pages 457-509 , A. HOWIE
RECENT PROGRESS IN HIGH VOLTAGE ELECTRON MICROSCOPY , Pages 511-549 , V.E. COSSLETT
SURFACE CHARACTERIZATION BY LOW ENERGY ELECTRON DIFFRACTION , Pages 553-589 , Peder J. ESTRUP
ADVANCES IN X-RAY AND NEUTRON DIFFRACTION TECHNIQUES , Pages 593-621 , A. GUINIER
TECHNIQUES AND INTERPRETATION IN X-RAY TOPOGRAPHY , Pages 623-714 , A.R. LANG
CONTRAST OF IMAGES IN X-RAY TOPOGRAPHY , Pages 715-757 , A. AUTHIER
MIRROR ELECTRON MICROSCOPY THEORY AND APPLICATIONS , Pages 761-788 , A.B. BOK
SURFACE STUDIES BY FIELD EMISSION , Pages 791-810 , Erwin W. MÜLLER
DEVELOPMENTS IN FIELD ION MICROSCOPY , Pages 811-847 , Erwin W. MÜLLER
SUBJECT INDEX TO VOLUMES I AND II , Pages xi-xvii
开源日期
2013-11-27
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