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Fault diagnosis and fault tolerance a systematic approach to special topics ; with 23 tables 🔍
Tʻing-huai Chʻen Springer Spektrum. in Springer-Verlag GmbH, Springer Nature, Berlin, Heidelberg, 2012
英语 [en] · PDF · 10.4MB · 2012 · 📗 未知类型的图书 · 🚀/duxiu/ia · Save
描述
With the rapid growth of integration scale of VLSI chips and the present need for reliable computers in space exploration, fault diagnosis and fault toleran ce have become more important than before, and hence reveal a lot of interest ing topics which attract many researchers to make a great number of contribu tions to this field. In recent years, many new and significant results have been achieved. A quick scan over the proceedings of the conferences on fault tolerant computing and design automation as well as on testing will convince the reader of that. But unfortunately these achievements have not been entire ly reflected in the textbooks, so that there seems to be a gap for the new researcher who already has the basic knowledge and wants to begin research in this area. As a remedy for this deficiency, this book is intended for begin ners, especially graduate students, as a textbook which will lead them to the frontier of some branches of the fault-tolerant computing field. The first chapter introduces the four-valued logic B4 and its applica tions. In 1966 Roth first proposed this four-valued logic as a technique to generate tests for logical circuits, but this work did not concern the mathe matical basis of B4 itself.
Erscheinungsdatum: 25.02.1992
备选标题
Fault Diagnosis and Fault Tolerance A Systematia Approach to Special Topics
备选作者
Chʻen, Tʻing-huai.
备用出版商
Steinkopff. in Springer-Verlag GmbH
备用出版商
Berlin ; New York: Springer-Verlag
备用出版商
Springer Berlin Heidelberg
备用出版商
Copernicus
备用出版商
Telos
备用版本
Softcover reprint of the original 1st ed. 1992, 1992
备用版本
United States, United States of America
备用版本
Berlin, New York, Germany, 1992
备用版本
Berlin, Heidelberg, 1992
备用版本
Germany, Germany
元数据中的注释
Includes bibliographical references.
备用描述
With the rapid growth of scale of integration of VLSI chips and the need forreliable computers, fault diagnosis and fault tolerance have become important topics in chip design and manufacture. This book is intended to lead new researchers in the field to the frontier of some branches of the fault-tolerant computing field. The book presents the results of a research group working at Chongqing University, China, for the last twelveyears. It contains seven chapters that can be read independently of each other. Chapter 1 gives a mathematical introduction to four-valued logic and its applications to test generation, hazard identification, and transition logic. Chapter 2 summarizes work on the fault-diagnosis problem at the system level, with society diagnosis and an analog circuit as examples. Chapter 3 discusses the definition of a testability measure, introduces the synthesis problem for testability, and studies automatic design for testability at gate level and module level. Chapter 4 introduces the new NMRC (N-modular redundancy with comparing) technique and studies some optimal designs. Chapter 5 studies the fault-tolerance of interconnection switching networks and shows how networks can be designed to increase the tolerated number of faulty elements. Chapter 6 shows how fault-tolerance problems for multibus systems correspond to connectivity problems for hypergraphs and how optimal connectivity is achieved with BIB (balanced incomplete block) designs. Chapter 7 discusses TMR (triple modular redundancy) systems
备用描述
xii, 197 p. : 24 cm
Includes bibliographical references
开源日期
2023-06-28
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